JAPAN - NIMS

NATIONAL INSTITUTE FOR MATERIALS SCIENCE

1-2-1, Sengen, Tsukuba, Ibaraki 305-0047

Telephone: +81 298 59 5028
Telefax: +81 298 59 2027
E-mail: NODA.Tetsuji@nims.go.jp
URL:   http://www.nims.go.jp

President: Kishi, Teruo

Nano-Fabrication Research Group
Noda, Tetsuji (Supervising Researcher)
Araki, Hiroshi
Suzuki, Hiroshi

Strong Magnetic Field Research Group
Wada, Hitoshi (Supervising Researcher)
Banno, Nobuya
Kiyoshi, Tsukasa
Takeuchi, Takao

Mechanical Properties Research Group
Yagi, Koichi (Supervising Researcher)
Fujitsuka, Masakazu
Fukuzawa, Yasumitsu
Kinugawa, Junichi
Murase, Yoshiharu
Mutoh, Isao
Nagakawa, Johsei
Yamamoto, Norikazu


Research activities:
The fabrication process of SiC composites for near plasma structurals has been investigated to raise their material performance. Isotopical control of these materials is also proceeded mainly aiming the further reduction of residual radioactivity. New superconductors for fusion application have been developed from the viewpoint of large critical current density (JC), high tolerance against mechanical stress and low sensitivity to radiation damage.

Recently, the significant improvement of JC has been achieved for multifilamentary Nb3Al over the wide range of magnetic field. Irradiation studies have been conducted using the NIMS compact cyclotron with an emphasis on mechanical response of reduced activation martensitic steels and vanadium alloys. Deformation and fracture behavior under irradiation and helium embrittlement resistance are examined through creep and/or fatigue tests during and after light ion irradiation. The influence of nuclear transmutations on the thermal conductivity and mechanical properties of W is evaluated through measurements on W-Re, -Os and -Hf alloys.

Radiation effects are estimated by reactor irradiation, as well. The database on nuclear materials information, called ''Data-Free-Way'', is being constructed under cooperation with outside institutions. The database comprises not only experimental data but also computer utilized tools for data analysis and simulation.

IAEA 2001
2001-10-31