Table of Contents
1. Introduction
1.1- Reflection phenomenon
1.1.1- Total reflection phenomenon
1.1.2- Critical angle in total reflection
1.1.3- Total reflection on low-pass filter
1.2- Basic TXRF Setup
1.2.1- TXRF Setup animated representation
1.3- TXRF for trace analysis purposes
1.4- Questions
1.4.1- Question 1.1
1.4.2- Question 1.2
1.4.3- Question 1.3
1.4.4- Question 1.4
1.4.5- Question 1.5
2. Instrumentation (spectrometer)
2.1- Spectrometric track
2.1.1- Detectors
2.1.2- The Si(Li) Detectors Crystal
2.1.3- Silicon Drift Detectors (SDDs)
2.1.4- SDD Principle
2.1.5- Signal processing
2.1.6- Spectra. Escape peaks. Sum peaks.
2.1.7- Spectrometer efficiency
2.1.8- Spectrometer energy resolution
2.1.9- Spectrometer dead time
2.2- Excitation sources
2.2.1- X-ray tube structure
2.2.2- The principle of x-ray tube operation
2.2.3- The X-ray Tube spectrum
2.3- Modifying the excitation spectrum
2.3.1- Cutoff effect
2.3.2- Monochromators
2.3.3- Bragg's Law
2.3.4- The mechanism of Bragg's diffraction
2.3.5- Animation of the Bragg's law
2.3.6- Multilayer structured mono-chromators
2.4- Sample positioning
2.4.1- Sample carrier
2.5- Adjustment
2.5.1- Primary beam collimation
2.5.2- The Choice of excitation spectrum modifier
2.5.3- X-ray optics adjustment
2.5.4- Illustration of TR condition adjustment
2.6- Questions
2.6.1- Question 2.1
2.6.2- Question 2.2
2.6.3- Question 2.3
2.6.4- Question 2.4
3. Quantification
3.1- Quantification model in TXRF
3.2- TXRF spectra
3.3- Internal standard
3.4- Calibration
3.5- Questions
3.5.1- Question 3.1
3.5.2- Question 3.2
3.5.3- Question 3.3
4. Sample preparation
4.1- Cleaning
4.2- Preparation
4.3- Presentation of samples
4.4- Questions
4.4.1- Question 4.1
4.4.2- Question 4.2
5. Applications
5.1- Industrial applications
5.2- Environmental applications
5.3- Medical and clinical applications
5.4- Archaeometry applications
5.5- Conclusions
6. Glossary